S3 Alliance - Supply, Service, Solutions

    PhotoVoltaic Anti Reflective Coating Thickness Measurement

    Nano View Logo Imaging Ellipsometer - Model IE-1000 Request more information Request more information
    Application
    • Reflectance and n & k
    • Thickness of antireflective coating (ARC) on textured (poly-) crystalline silicon solar cell
    Wavelength 400-950 nm (1.3-3.0 eV)
    Accuracy 104.5 nm (PV-ARC measurement) for 104.8 nm (Reference) SiO2 on c-Si*
    (thickness measurement on specular sample*)
    Number of layers Up to 3 layers on specular sample (depending on layers)
    Thickness range 10 nm ~ 30 μm depending on sample
    Data acquisition time < 1 s
    Beam spot size 1 mm (optional ~ 50 μm)
    Focusing of beam Manual / optional : auto-focus
    Sample stage
    • Manual X-Y stage (specify sample size and travel distance) Option:
    • Automatic X-Y stage for mapping (specify sample size and travel distance)
    Off-axis microscope Optional
    PC, monitor Windows XP system with LCD monitor
    software
    • Nano-view developed software for:
    • Multi-layer analysis of reflectance (specular surface)
    • Reflectance measurement of textured surface
    • Single layer analysis of ARC on (poly-) crystalline solar cell (textured surface)

    * certified reference material from Korea Research Institute of Standard and Science