Sigmatech Inc.
Sigmatech offers a broad range of high precision metrology and inspection systems for the Semiconductor, MEMS, optical and other related industries for Production and R&D environments:
- Wafer Dimensional Metrology
- Thickness, TTV, Bow, Warp measurement;
- Wafer Characterization;
- Layer thickness measurement;
- Ultrathin wafer substrates,
- Wafer Surface Metrology
- Non-contact Surface profilometry
- Roughness measurement
- MEMS
- Bumps dimensions
- Film Thickness
- Step Heigth, cavities