Semiconductor/MEMs
Process Equipment
Facilities Equipment
Parts & Consumables
- CMP Conditioning Discs
- CMP Polishing Pads
- CMP Retaining Rings
- CMP Slurry
- Chemical Heaters
- Deionized Water Heaters
- Dicing
- Electrostatic Chucks
- FOUP / FOSB
- Four Point Probe Heads
- Heater Pedestals
- High Purity Pumps
- MagLev Pumps
- Metal Cassettes
- Process Cassette/Carriers
- Reticle/Mask Handling
- Shipping Boxes
- Stepper Chucks
Service
Cleaning Products
Sigmatech Inc.
Sigmatech offers a broad range of high precision metrology and inspection systems for the Semiconductor, MEMS, optical and other related industries for Production and R&D environments:
- Wafer Dimensional Metrology
- Thickness, TTV, Bow, Warp measurement;
- Wafer Characterization;
- Layer thickness measurement;
- Ultrathin wafer substrates,
- Wafer Surface Metrology
- Non-contact Surface profilometry
- Roughness measurement
- MEMS
- Bumps dimensions
- Film Thickness
- Step Heigth, cavities