Non-Contact Thickness Metrology
Sigmatech offers metrology solutions to a broad range of standard and specific applications in the field of semiconductor wafers, materials and optics.
Using multiple sensing technologies, they are virtually no limits to the capabilities:
- Conductive or non-conductive substrates
- Reflective or non reflective
- Polished or non polished
- Wet or dry environment
- Round, square or rectangle
- Sizes up to 600mm
- Non contact solutions with automated calibration